Modeling and Simulation of High Speed VLSI Interconnects: A by Michel S. Nakhla, Q.J. Zhang PDF

Read Online or Download Modeling and Simulation of High Speed VLSI Interconnects: A Special Issue of Analog Integrated Circuits and Signal Processing An International Journal Vol. 5, No. 1 (1994) PDF

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Additional resources for Modeling and Simulation of High Speed VLSI Interconnects: A Special Issue of Analog Integrated Circuits and Signal Processing An International Journal Vol. 5, No. 1 (1994)

Sample text

Integration into a circuit simulator requires that the interconnect system be described in terms of voltages and 34 Devarayanadurg and Soma yauxjCI) = ij{l) x Zo i=1,2,3 ... 2N .. ijCI)-controlling current, yaU\CI) -controlled voltage ij yauxj(l) ----.. + v1q(t) Zo Zo Zo + + Fig. 3. Quasi-terminated interconnect system. currents rather than wave quantities. The relations between the wave variables and the different circuit quantities is described in the following. Let V; (w) and Ii (w) be the frequency domain port line voltage and current vectors of the transmission line system shown in figure 3.

5). 4) then become linear equations in the n Cs, with known coefficients. 5). Appendix B. Error in Delay Estimation In this study the interconnect is characterized in terms of its scattering matrix which is essentially a matrix of data points. 2. Typical errors which are noticed by using the method suggested is studied through the example of the transmission line shown in figure 8a. The phase response for the transmission scattering coefficient is shown in figure 9. 929 ns. 933 ns. 5%. 44 Devarayanadurg and Soma figure 12.

0 6 4 ... lm) Fig. 9. 1 mm. 08 ....... (a) ....... (b) ....... 06,...... p.. o::J ......... 04 § "-' o 2 4 6 8 10 Fig. 10. 9. 1 mm. 2 mm. 0 GHz, Electromagnetic Analysis of Multiconductor Losses which effectively confirms the above argument. This is to say that line losses for all modes can be estimated if loss information of a relevant single line is calculated provided that the conductor thickness is greater than the limiting case (at least greater than the inherent skin depth).

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