By Michael Haschke
ISBN-10: 3319048635
ISBN-13: 9783319048635
ISBN-10: 3319048643
ISBN-13: 9783319048642
Micro-X-ray fluorescence bargains the prospect for a place- delicate and non-destructive research that may be used for the research of non-homogeneous fabrics and layer platforms. This analytical procedure has proven a dynamic improvement within the final 15 years and is used for the research of small debris, inclusions, of elemental distributions for quite a lot of diversified purposes either in examine and qc. the 1st experiments have been played on synchrotrons yet there's a requirement for laboratory tools which deals a quick and fast entry for analytical effects. The e-book speak about the most elements of a µ-XRF device and different size modes, it supplies an outline in regards to the numerous tools forms, considers the unique standards for quantification of non-homogeneous fabrics and provides quite a lot of software for unmarried element and multi-point research in addition to for distribution research in a single, and 3 dimensions.
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Extra info for Laboratory Micro-X-Ray Fluorescence Spectroscopy: Instrumentation and Applications
Example text
It shows the thin layer of electron scattering where both secondary and backscattered electrons are generated that makes the image in electron microscopes and it shows the ‘ionization pear’ which is emitting X-rays both from primary and secondary fluorescence. The generation of X-Rays by an incident electron beam is used in X-ray tubes as well as in electron microscopes. In X-ray tubes the target material typically is a pure element that emits only the characteristic radiation of this element. In contrast to that in an electron microscope the target is the sample itself which consists of different elements.
For Bragg-angles close to 90°. That means the longest wavelength is defined by the d-spacing of the crystal. Typical d-spacing’s are in the range of a few tenth of a nanometer and therefore the spectrometry of long wavelength with crystal optics is limited for these wavelengths too. e. of elements lighter than Si requires special crystal structures for the diffraction for example organic crystalline structures or compound crystals. The short wavelength or high energy side is limited by the angular resolution of the spectrometer.
H. Hansteen, P. Ippach, A. Knöchel, M. Radtke, C. M. U. J. Ullrich, J. Trace Microprobe Tech. 14–3, 561 (1996) 13. P. Chevallier, P. Dhez, F. Legrand, A. Erko, Y. A. Panchanko, A. Yakshin, J. Trace Microprobe Tech. 14–3, 517 (1996) 16 1 XRF-Basics 14. K. Janssens, L. Vincze, B. Vekemans, F. Adams, M. Haller, A. Knöchel, J. Anal. At. Spectr. 13, 339 (1998) 15. G. von Hevesy, Chemical Analysis by X-Rays and Its Application (McGraw Hill, New York, 1932) 16. R. Glocker, H. Schrieber, Ann. Phys. 85, 130 (1928) 17.
Laboratory Micro-X-Ray Fluorescence Spectroscopy: Instrumentation and Applications by Michael Haschke
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