By Koen Lampaert
ISBN-10: 1441950834
ISBN-13: 9781441950833
ISBN-10: 147574501X
ISBN-13: 9781475745016
Analog built-in circuits are vitally important as interfaces among the electronic elements of built-in digital structures and the skin global. a wide section of the trouble curious about designing those circuits is spent within the structure part. while the actual layout of electronic circuits is computerized to a wide volume, the structure of analog circuits continues to be a handbook, time-consuming and error-prone activity. this is often often a result of non-stop nature of analog indications, which explanations analog circuit functionality to be very delicate to format parasitics. The parasitic components linked to interconnect wires reason loading and coupling results that degrade the frequency behaviour and the noise functionality of analog circuits. equipment mismatch and thermal results placed a primary restrict at the feasible accuracy of circuits. For winning automation of analog format, complicated position and course instruments that may deal with those severe parasitics are required.
some time past, computerized analog format instruments attempted to optimize the format with no quantifying the functionality degradation brought by means of structure parasitics. hence, it was once now not assured that the ensuing structure met the requisites and a number of structure iterations will be wanted. In Analog format new release for functionality andManufacturability, the authors suggest a functionality pushed format technique to conquer this challenge. during this technique, the structure instruments are pushed via functionality constraints, such that the ultimate structure, with parasitic results, nonetheless satisfies the requisites of the circuit. The functionality degradation linked to an intermediate structure resolution is evaluated at runtime utilizing predetermined sensitivities. by contrast with different functionality pushed structure methodologies, the instruments proposed during this e-book function at once at the functionality constraints, with out an intermediate parasitic constraint new release step. This procedure makes a whole and good trade-off among the various format choices attainable at runtime and for this reason gets rid of the prospective suggestions course among constraint derivation, placement and structure extraction.
in addition to its impression at the functionality, structure additionally has a profound influence at the yield and testability of an analog circuit. In AnalogLayout new release for functionality and Manufacturability, the authors define a brand new criterion to quantify the detectability of a fault and mix this with a yield version to judge the testability of an built-in circuit structure. They then combine this method with their functionality pushed routing set of rules to supply layouts that experience optimum manufacturability whereas nonetheless assembly their functionality necessities.
Analog format iteration for functionality and Manufacturability could be of curiosity to analog engineers, researchers and students.
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Additional resources for Analog Layout Generation for Performance and Manufacturability
Sample text
A discussion of the techniques which are used to determine the distribution of P, based on the distributions of the different parameters, goes beyond the scope of this book. The reader is referred to the excellent overview articles which exist on this topic [Maly 86, Maly 90, Chang 95]. 2: (a) performance specification (b) nominal performance (C) performance variation due to process variations (d) performance margins for layout tools. which contains all possible values of P if process variations are taken into account (see Fig.
In particular. large FET devices can be folded to allow a single source or drain diffusion to be shared by two gate regions. Device folding is illustrated in Fig. 9(a). An additional large saving in diffusion capacitance can be made by device merging. e. placing devices such that diffusion geometry is shared between electrically connected devices as shown in Fig. 9(b). This type of geometry sharing has the additional benefit of improving the layout density. If spacing rules permit. additional capacitance and resistance can be saved by making the connection between some adjacent devices by abutment, rather than by explicit wiring (see Fig.
To achieve this, the constraint generation algorithm reported in [Choudhury 90b, Choudhury 93] and extended in [Charbon 93] used the notion of layout flexibility associated with a parasitic constraint to express the ease with which the constraint can be met during layout design. lpF parasitic capacitance is almost impossible and therefore will constrain the routing tool too tightly. Hence, during constraint generation, the sum of the layout f1exibilities of all parasitic constraints is maximized, subject to the performance constraints.
Analog Layout Generation for Performance and Manufacturability by Koen Lampaert
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